Devices and Services Company
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TECHNICAL NOTES Number Title TN 78-2 Emissometer Model AE TN 79-17 Emissivity Measurements for In-Place Surfaces and for Materials with Low Thermal Conductivity TN 81-1 Use of Emissometer for Semi-Transparent Materials Modifications TN 81-2 Measurement of Emittance of Cylindrical Surfaces TN 84-2 Emissometer Adapter Model AE-AD1 TN 84-3 Measuring Low Emittance Materials with the Emissometer Model AE TN 85-1 Secondary Standards for the Emissometer Model AE TN 92-1 Emissometer Model AE - Hemispherical vs. Normal Emittance TN 04-1 Slide Method for AE Measurements |
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